• DocumentCode
    1956576
  • Title

    Manipulation of living cells by atomic force microscopy

  • Author

    Li, Guangyong ; Xi, Ning ; Yu, Mengmeng ; Salem, Fathi ; Wang, Donna H. ; Li, Jianping

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
  • Volume
    2
  • fYear
    2003
  • fDate
    20-24 July 2003
  • Firstpage
    862
  • Abstract
    Currently there is a great interest in using atomic force microscopy (AFM) to study living cells under biophysiological conditions. It has been shown that problems invoked by the deformation and destruction of soft biological materials can be solved by using tapping mode AFM. Besides the capability of AFM to characterize the membrane surface of living cells, it can be employed to modify surfaces and manipulate nano sized structures. By feeding force information measured from AFM to a haptic joystick, an augmented reality is developed. Under the assistance of the augmented virtual reality, the operator can monitor the tip position and feel the three dimensional forces which are proportional to the actual forces acting on the cantilever during nanomanipulation. The experimental study shows the effectiveness of the proposed scheme.
  • Keywords
    atomic force microscopy; augmented reality; biomembranes; cellular biophysics; interactive devices; laboratory techniques; materials handling; micromanipulators; actual forces; atomic force microscopy; augmented virtual reality; biophysiological conditions; deformation; feeding force information; haptic joystick; living cells; membrane surface; nanomanipulation; nanosized structures; soft biological materials; tapping mode; three dimensional forces; tip position; Atomic force microscopy; Biological materials; Biomedical imaging; Cells (biology); Electrons; Force measurement; Haptic interfaces; Nanobioscience; Surface topography; Virtual reality;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Intelligent Mechatronics, 2003. AIM 2003. Proceedings. 2003 IEEE/ASME International Conference on
  • Print_ISBN
    0-7803-7759-1
  • Type

    conf

  • DOI
    10.1109/AIM.2003.1225455
  • Filename
    1225455