Title :
Design on method of Statistical Process Control (SPC) based on RFID technology
Author :
Li, Jiaqi ; Zhang, Qing ; Li, Bowei
Author_Institution :
Grad. Sch. at Shenzhen, Tsinghua Univ., Shenzhen, China
Abstract :
In the application of Statistical Process Control (SPC), a traditional method in quality management, in order to ensure the accuracy of the data, we often copy the data in hand, manually calculate, and then dot. So it would be very time-consuming and labor-intensive. For this situation enhancement, enterprises have developed automatic data collection system and control charts analysis system with the high cost, and real-time control to the quality of the production process can not be achieved. In this paper, in order to combine automatic data collection and automatic control charts, the rapidly developing RFID technology is integrated into SPC. Automatic data collection and utilization of algorithms to determine quality of products are effective. By setting timers in RFID tags, a real-time effective control to quality of work pieces on production line could come true. At the same time, 12864 LCD (liquid crystal display) is introduced to SPC system, which is more convenient for producers to adjust the production process and wiser for managers to do production management. What is more important, it lays the foundation for the reform of the manufacturing sector.
Keywords :
control charts; data acquisition; liquid crystal displays; production management; quality control; radiofrequency identification; statistical process control; LCD; RFID technology; automatic data collection system; control charts analysis system; liquid crystal display; production line; production management; quality management; real-time quality control; statistical process control method; Conferences; Control charts; Process control; Quality control; Radiofrequency identification; Real time systems; SPC RFID 12864LCD;
Conference_Titel :
Supply Chain Management and Information Systems (SCMIS), 2010 8th International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-962-367-696-0