Title :
Crystallization Characteristics and Recording Mechanism of a-Si/Ni Bilayer and Its Potential for use in Write-Once Blue Ray Disk
Author :
Her, Yung-Chiun ; Jean, Sen-Tsun
Author_Institution :
Dept. of Mater. Eng., Nat. Chung-Hsing Univ., Taichung
Abstract :
In this work, the crystallization characteristics and recording mechanism of a-Si/Ni bilayer recording film under thermal annealing and pulsed laser irradiation are investigated. The optical properties of the a-Si/Ni bilayer recording film before and after annealing were measured. In addition, the dynamic test was conducted to evaluate the potential of the a-Si/Ni bilayer for use in the write-once blue-ray disk
Keywords :
amorphous semiconductors; annealing; crystallisation; elemental semiconductors; laser beam effects; nickel; optical disc storage; optical films; silicon; thermo-optical effects; thin films; Si-Ni; a-Si/Ni bilayer; crystallization; dynamic test; pulsed laser irradiation; recording film; recording mechanism; thermal annealing; write-once blue ray disk; Amorphous materials; Annealing; Crystallization; Disk recording; Heating; Optical films; Optical pulses; Optical recording; Reflectivity; Temperature;
Conference_Titel :
Optical Data Storage Topical Meeting, 2006
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-9494-1
DOI :
10.1109/ODS.2006.1632724
