DocumentCode :
1956968
Title :
Guided Problem Diagnosis through Active Learning
Author :
Duan, Songyun ; Babu, Shivnath
Author_Institution :
Dept. of Comput. Sci., Duke Univ., Durham, NC
fYear :
2008
fDate :
2-6 June 2008
Firstpage :
45
Lastpage :
54
Abstract :
There is widespread interest today in developing tools that can diagnose the cause of a system failure accurately and efficiently based on monitoring data collected from the system. Over time, the system monitoring data will contain two types of failure data: (i) annotated failure data L, which is monitoring data collected from failure states of the system, where the cause of failure has been diagnosed and attached as annotations with the data; and (ii) unannotated failure data U. Previous work on wholly- or partially-automated diagnosis focused on L or U in isolation. In this paper, we argue that it is important to consider both L and U together to improve the overall accuracy of diagnosis; and in particular, to proactively move instances from U to L. However, such movement requires manual diagnosis effort from system administrators. Since manual diagnosis is expensive and time-consuming, we propose an algorithm to make the best use of manual effort while maximizing the benefit gained from newly diagnosed instances. We report an experimental evaluation of our algorithm using data from a variety of failures - both single failures and multiple correlated failures - injected in a testbed, as well as with synthetic data.
Keywords :
learning (artificial intelligence); program diagnostics; system recovery; active learning; data monitoring; guided problem diagnosis; multiple correlated failures; system failure; system monitoring data; Banking; Computer crashes; Computer science; Computerized monitoring; Condition monitoring; Costs; Databases; Hardware; Software performance; Vehicle crash testing; Automated diagnosis; active learning; performance problems; self-healing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Autonomic Computing, 2008. ICAC '08. International Conference on
Conference_Location :
Chicago, IL
Print_ISBN :
978-0-7695-3175-5
Electronic_ISBN :
978-0-7695-3175-5
Type :
conf
DOI :
10.1109/ICAC.2008.28
Filename :
4550826
Link To Document :
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