DocumentCode
1956997
Title
Simplified and practical estimation of package cracking during reflow soldering process
Author
Sawada, K. ; Nakazawa, T. ; Kawamura, N. ; Matsumoto, K. ; Hiruta, Y. ; Sudo, T.
Author_Institution
Semicond. Device Eng. Lab., Toshiba Corp., Kawasaki, Japan
fYear
1994
fDate
11-14 April 1994
Firstpage
114
Lastpage
119
Abstract
A simple method has been developed to estimate cracking of plastic packages during reflow soldering process. A criterion for estimating package cracking has been introduced by comparing the mold resin fracture toughness and the maximum value of the stress intensity factor in the package. The criterion equation for package cracking was made to an empirical form. The real-time measurement of package deformation is effective for providing information on the difference of the fracture mode. The difference of the delamination in the package causes the different shape of the deformation curve. The absorption characteristic of the package obeys Fick´s law even for thinner packages.<>
Keywords
circuit reliability; delamination; fracture toughness testing; packaging; soldering; Fick´s law; absorption characteristic; delamination; fracture mode; mold resin fracture toughness; package cracking; package deformation; plastic packages; real-time measurement; reflow soldering process; stress intensity factor; Absorption; Delamination; Electronics packaging; Moisture; Plastics; Reflow soldering; Resins; Semiconductor device packaging; Semiconductor devices; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1994. 32nd Annual Proceedings., IEEE International
Conference_Location
San Jose, CA, USA
Print_ISBN
0-7803-1357-7
Type
conf
DOI
10.1109/RELPHY.1994.307848
Filename
307848
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