• DocumentCode
    1956997
  • Title

    Simplified and practical estimation of package cracking during reflow soldering process

  • Author

    Sawada, K. ; Nakazawa, T. ; Kawamura, N. ; Matsumoto, K. ; Hiruta, Y. ; Sudo, T.

  • Author_Institution
    Semicond. Device Eng. Lab., Toshiba Corp., Kawasaki, Japan
  • fYear
    1994
  • fDate
    11-14 April 1994
  • Firstpage
    114
  • Lastpage
    119
  • Abstract
    A simple method has been developed to estimate cracking of plastic packages during reflow soldering process. A criterion for estimating package cracking has been introduced by comparing the mold resin fracture toughness and the maximum value of the stress intensity factor in the package. The criterion equation for package cracking was made to an empirical form. The real-time measurement of package deformation is effective for providing information on the difference of the fracture mode. The difference of the delamination in the package causes the different shape of the deformation curve. The absorption characteristic of the package obeys Fick´s law even for thinner packages.<>
  • Keywords
    circuit reliability; delamination; fracture toughness testing; packaging; soldering; Fick´s law; absorption characteristic; delamination; fracture mode; mold resin fracture toughness; package cracking; package deformation; plastic packages; real-time measurement; reflow soldering process; stress intensity factor; Absorption; Delamination; Electronics packaging; Moisture; Plastics; Reflow soldering; Resins; Semiconductor device packaging; Semiconductor devices; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 1994. 32nd Annual Proceedings., IEEE International
  • Conference_Location
    San Jose, CA, USA
  • Print_ISBN
    0-7803-1357-7
  • Type

    conf

  • DOI
    10.1109/RELPHY.1994.307848
  • Filename
    307848