DocumentCode
1957076
Title
THB reliability models and life prediction for intermittently-powered nonhermetic components
Author
Shirley, C. Glenn
Author_Institution
Intel Corp., Hillsboro, OR, USA
fYear
1994
fDate
11-14 April 1994
Firstpage
72
Lastpage
78
Abstract
Results of temperature-humidity-bias (THB) acceleration experiments are often expressed in terms of a power-law function of relative humidity and an Arrhenius temperature dependence (Peck\´s model). For steady-state operation, we show how to calculate the effect of power dissipation on service life (or its reciprocal, acceleration). We derive an interesting inequality involving Peck model parameters which determines whether a moisture-related mechanism is accelerated or decelerated by increased power dissipation. For intermittently-powered components the steady-state acceleration is multiplied by a time-on factor (TOF). We introduce a new, broadly applicable, formula for the TOF. The formula involves thermodynamic properties of the molding compound encapsulating the die. The formula applies to most plastic encapsulated devices under typical "use" conditions.<>
Keywords
circuit reliability; encapsulation; life testing; Arrhenius temperature dependence; Peck´s model; THB reliability models; intermittently-powered nonhermetic components; life prediction; moisture-related mechanism; molding compound; plastic encapsulated devices; power dissipation; power-law function; service life; steady-state acceleration; temperature-humidity-bias acceleration; thermodynamic properties; time-on factor; Acceleration; Humidity; Moisture; Packaging; Power dissipation; Predictive models; Steady-state; Stress; Temperature dependence; Thermodynamics;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 1994. 32nd Annual Proceedings., IEEE International
Conference_Location
San Jose, CA, USA
Print_ISBN
0-7803-1357-7
Type
conf
DOI
10.1109/RELPHY.1994.307854
Filename
307854
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