DocumentCode
1957193
Title
Volumetric Phase Metrology for Optical Data Storage
Author
Ayres, Mark R. ; McLeod, Robert R.
Author_Institution
Dept. of Electr. Eng., Colorado Univ., Boulder, CO
fYear
0
fDate
0-0 0
Firstpage
132
Lastpage
134
Abstract
Index modulation patterns constituting volumetric optical memories are quantitatively measured with a novel scanning microscope. The instrument uses a PSD to provide phase sensitivity and achieves confocal-like depth selectivity in transmission without a pinhole
Keywords
optical microscopes; optical storage; position measurement; PSD; confocal-like depth selectivity; optical data storage; phase sensitivity; position sensing detector; scanning microscope; volumetric phase metrology; Holographic optical components; Holography; Memory; Metrology; Nonlinear optics; Optical interferometry; Optical refraction; Optical sensors; Optical variables control; Probes;
fLanguage
English
Publisher
ieee
Conference_Titel
Optical Data Storage Topical Meeting, 2006
Conference_Location
Montreal, Que.
Print_ISBN
0-7803-9494-1
Type
conf
DOI
10.1109/ODS.2006.1632742
Filename
1632742
Link To Document