DocumentCode
1957911
Title
Measurement of the Temperature Coefficient of Permittivity for MIC Substrate Materials
Author
Aitken, J.E. ; Ladbrooke, P.H. ; Potok, M.H.N.
Author_Institution
Department of Electrical and Electronic Engineering, Royal Military College of Science, Shrivenham, Swindon, SN6 8LA, England
Volume
2
fYear
1973
fDate
4-7 Sept. 1973
Firstpage
1
Lastpage
4
Keywords
Dielectric constant; Dielectric measurements; Dielectric substrates; Frequency; Microwave integrated circuits; Permittivity measurement; Resonance; Size measurement; Temperature measurement; Thermal expansion;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1973. 3rd European
Conference_Location
Brussels, Belgium
Type
conf
DOI
10.1109/EUMA.1973.331784
Filename
4130280
Link To Document