DocumentCode :
1957934
Title :
Evalution of bulk titanium DRIE Using SU-8 as soft mask
Author :
Zhao, Gang ; Tian, Yao ; Shu, Qiong ; Chen, Jing
Author_Institution :
Nat. Key Lab. of Nano/Micro Fabrication Technol., Peking Univ., Beijing
fYear :
2009
fDate :
5-8 Jan. 2009
Firstpage :
514
Lastpage :
517
Abstract :
This paper reports the characterization of bulk titanium deep etching using inductively coupled chlorine plasma using SU-8 as softmask. SU-8 has many advantages over the traditional employed hardmask, such as selective stripping, cost efficiency and the ability to accommodate ultra deep etching. The effects of process parameters (ICP source power, platen power and Cl2 flow rate) on etch rate, selectivity and the etch profile were investigated. With the optimized process parameters (400 W ICP source power, 100 W platen power, 60 sccm Cl2 flow rate, 3 mT chamber pressure), an etch rate of 1.06 mum/min has been achieved with an aspect ratio of 5:1 and smooth surface. Ultra-deep titanium etching up to 200 mum has been realized with SU-8 softmask, which is among the best of the present reports.
Keywords :
masks; optimisation; plasma materials processing; plasma sources; sputter etching; titanium; ICP source power; SU-8 softmask; Ti; bulk titanium DRIE; cost efficiency; deep reactive ion etching; etch profile; inductively coupled chlorine plasma; optimized process parameters; power 100 W; power 400 W; ultra deep etching; Fabrication; Plasma applications; Plasma chemistry; Plasma sources; Plasma temperature; Silicon; Sputter etching; Substrates; Systems engineering and theory; Titanium; DRIE; SU-8; Titanium; profile; softmask;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2009. NEMS 2009. 4th IEEE International Conference on
Conference_Location :
Shenzhen
Print_ISBN :
978-1-4244-4629-2
Electronic_ISBN :
978-1-4244-4630-8
Type :
conf
DOI :
10.1109/NEMS.2009.5068631
Filename :
5068631
Link To Document :
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