• DocumentCode
    1957944
  • Title

    Placement driven retiming with a coupled edge timing model

  • Author

    Neumann, I. ; Kunz, W.

  • Author_Institution
    Dept. of Comput. Sci., Frankfurt Univ., Germany
  • fYear
    2001
  • fDate
    4-8 Nov. 2001
  • Firstpage
    95
  • Lastpage
    102
  • Abstract
    Retiming is a widely investigated technique for performance optimization. It performs powerful modifications on a circuit netlist. However, often it is not clear whether the predicted performance improvement will still be valid after placement has been performed. This paper presents a new retiming algorithm using a highly accurate timing model taking into account the effect of retiming on capacitive loads of single wires as well as fanout systems. We propose the integration of retiming into a timing-driven standard cell placement environment based on simulated annealing. Retiming is used as an optimization technique throughout the whole placement process. The experimental results show the benefit of the proposed approach. In comparison with the conventional design flow based on standard FEAS (Leiserson and Saxe, J. VLSI and Computer Sys., pp. 41-67, 1983; and Algorithmica vol. 6, no 1, pp. 5-35, 1991.), our approach achieved an improvement in cycle time of up to 34% and 17% on the average.
  • Keywords
    circuit layout; circuit optimisation; logic design; sequential circuits; simulated annealing; timing; FEAS algorithin; capacitive loads; circuit netlist modifications; coupled edge timing model; cycle time; fanout systems; optimization technique; performance improvement; performance optimization; placement driven retiming; placement process; retiming; retiming algorithm; retiming integration; sequential circuits; simulated annealing; timing model; timing-driven standard cell placement environment; CMOS technology; Circuit testing; Coupling circuits; Delay; Logic testing; Optimization; Registers; Semiconductor device modeling; Timing; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Aided Design, 2001. ICCAD 2001. IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA, USA
  • ISSN
    1092-3152
  • Print_ISBN
    0-7803-7247-6
  • Type

    conf

  • DOI
    10.1109/ICCAD.2001.968604
  • Filename
    968604