1957947

Accurate Measurement of Complex Permittivity of Low-Loss MIC Substrate Slabs

Ermert, H.

Institut fuer Hochfrequenztechnik, Universitaet Erlangen-Nuernberg, D-8520 Erlangen, Cauerstr. 9, F.R. Germany

2

1973

4-7 Sept. 1973

1

4

Dielectric constant; Dielectric loss measurement; Dielectric materials; Dielectric measurements; Dielectric substrates; Equations; Microwave integrated circuits; Permittivity measurement; Resonant frequency; Slabs;

English

ieee

Microwave Conference, 1973. 3rd European

Brussels, Belgium

conf

10.1109/EUMA.1973.331786

4130282