Title :
A Coverage-Driven Constraint Random-Based Functional Verification Method of Memory Controller
Author :
Wu, Yingpan ; Yu, Lixin ; Lan, Lidong ; Zhou, Haiyang
Author_Institution :
Beijing Microelectron. Technol. Inst., Beijing
Abstract :
This paper presents a coverage-driven Constraint random-based functional verification method of memory controller in a microprocessor. Many special functions are integrated into this memory controller for anti-radiating, so it is more difficult to verify . This system of verification, which is creating by means of verification methodology manual (VMM) for systemverilog and classification trees, is reusable, scalable, configurable and can reduce time of verification.
Keywords :
logic testing; microcontrollers; SystemVerilog language; classification trees; coverage-driven constraint random-based functional verification; memory controller; microprocessor chip; Classification tree analysis; Computer aided manufacturing; Control systems; Design automation; Error correction; Microelectronics; Microprocessors; Object oriented modeling; PROM; System testing; VMM; classification trees; functional verification; memory controller; systemverilog;
Conference_Titel :
Rapid System Prototyping, 2008. RSP '08. The 19th IEEE/IFIP International Symposium on
Conference_Location :
Monterey, CA
Print_ISBN :
978-0-7695-3180-9
DOI :
10.1109/RSP.2008.12