A Coverage-Driven Constraint Random-Based Functional Verification Method of Memory Controller

Author

Wu, Yingpan ; Yu, Lixin ; Lan, Lidong ; Zhou, Haiyang

Author_Institution

Beijing Microelectron. Technol. Inst., Beijing

fYear

2008

fDate

2-5 June 2008

Firstpage

99

Lastpage

104

Abstract

This paper presents a coverage-driven Constraint random-based functional verification method of memory controller in a microprocessor. Many special functions are integrated into this memory controller for anti-radiating, so it is more difficult to verify . This system of verification, which is creating by means of verification methodology manual (VMM) for systemverilog and classification trees, is reusable, scalable, configurable and can reduce time of verification.

Keywords

logic testing; microcontrollers; SystemVerilog language; classification trees; coverage-driven constraint random-based functional verification; memory controller; microprocessor chip; Classification tree analysis; Computer aided manufacturing; Control systems; Design automation; Error correction; Microelectronics; Microprocessors; Object oriented modeling; PROM; System testing; VMM; classification trees; functional verification; memory controller; systemverilog;

fLanguage

English

Publisher

ieee

Conference_Titel

Rapid System Prototyping, 2008. RSP '08. The 19th IEEE/IFIP International Symposium on

Conference_Location

Monterey, CA

ISSN

1074-6005

Print_ISBN

978-0-7695-3180-9

Type

conf

DOI

10.1109/RSP.2008.12

Filename

4550894