Title :
Design and implementation of software system of E-beam lithography based on SEM
Author :
Wei, Shuhua ; Zhang, Jinzhao ; Han, Li
Author_Institution :
Microelectron. Center, North China Univ. of Technol., Beijing
Abstract :
In this paper, a newly developed software system for electron beam lithography based on SEM is introduced. This software system consists of exposure layout processing functional module, alignment control functional module and exposure control functional module. It can accomplish the microlithography and micro-nanofabrication layouts design, generate the exposure data files, detect and correct the hardware, and control the whole process of exposure. Furthermore, the software system can be used in various electron beam lithography systems based on scanning electron microscope (SEM) with its powerful functions and friendly manipulation. The software system plays an important role in the electron beam lithography system based on SEM.
Keywords :
electron beam lithography; microfabrication; modules; nanofabrication; scanning electron microscopy; SEM; alignment control functional module; electron beam lithography; exposure control functional module; exposure data files; exposure layout processing functional module; microfabrication layout design; microlithography; nanofabrication layout design; scanning electron microscope; software system; Control systems; Design engineering; Electron beams; Lithography; Nanofabrication; Nanolithography; Process control; Scanning electron microscopy; Shape control; Software systems; Control Software System; Electron Beam Lithography; Layout Design; Micro-nanofabrication; Overlay;
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2009. NEMS 2009. 4th IEEE International Conference on
Conference_Location :
Shenzhen
Print_ISBN :
978-1-4244-4629-2
Electronic_ISBN :
978-1-4244-4630-8
DOI :
10.1109/NEMS.2009.5068639