• DocumentCode
    1958212
  • Title

    CMUTs with improved electrical safety & minimal dielectric surface charging

  • Author

    Zhang, Peiyu ; Fitzpatrick, Glen ; Moussa, Walied ; Zemp, Roger J.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Alberta, Edmonton, AB, Canada
  • fYear
    2010
  • fDate
    11-14 Oct. 2010
  • Firstpage
    1881
  • Lastpage
    1885
  • Abstract
    Capacitive micromachined ultrasound transducers (CMUTs) offer many potential advantages over piezoelectric transducers, but have not yet seen widespread implementation. Possible reasons for this may include key issues of (1) long-term device reliability and (2) electrical safety issues associated with relatively high voltage electrodes on device surfaces which could present an electrical safety hazard to patients. A double SOI CMUT design which addresses both these issues is presented. A 1-D model of dielectric surface charging, which suggests that minimal surface roughness of the dielectric layer can minimize surface charge accumulation is also proposed. Fabricated devices are engineered to minimize dielectric surface roughness. To provide maximum electrical safety to future patients, CMUT devices were engineered with the top membrane serving as a ground electrode. Bottom electrodes are individually-addressable. Our devices were modeled using a finite-element package. The experiment results show excellent agreement with modeled performance. Charge effects were explored by studying deflection hysteresis during snapdown and snapback cycles in the limit of long snapdown durations to simulate maximal dielectric charging conditions.
  • Keywords
    capacitive sensors; electrical safety; electrodes; finite element analysis; surface charging; surface roughness; ultrasonic transducers; capacitive micromachined ultrasound transducers; deflection hysteresis; dielectric surface charging; dielectric surface roughness; electrical safety hazard; electrodes; finite-element package; piezoelectric transducers; Dielectrics; Electrodes; Finite element methods; Rough surfaces; Semiconductor device modeling; Surface charging; Surface roughness; CMUTs; MEMS; dielectric charging; electrical safety;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium (IUS), 2010 IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1948-5719
  • Print_ISBN
    978-1-4577-0382-9
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2010.5935744
  • Filename
    5935744