Title :
ASF: a practical simulation-based methodology for the synthesis of custom analog circuits
Author :
Krasnicki, M.J. ; Phelps, R. ; Hellums, J.R. ; McClung, M. ; Rutenbar, R.A. ; Carley, L.R.
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
Abstract :
This paper describes ASF, a novel cell-level analog synthesis framework that can size and bias a given circuit topology subject to a set of performance objectives and a manufacturing process. To manage complexity and time-to-market, SoC designs require a high level of automation and reuse. Digital methodologies are inapplicable to analog IP, which relies on tight control of low-level device and circuit properties that vary widely across manufacturing processes. This analog synthesis solution automates these tedious, technology specific aspects of analog design. Unlike previously proposed approaches, ASF extends the prevalent "schematic and SPICE" methodology used to design analog and mixed-signal circuits. ASF is topology and technology independent and can be easily integrated into a commercial schematic capture design environment. Furthermore, ASF employs a novel numerical optimization formulation that incorporates classical downhill techniques into stochastic search. ASF consistently produces results comparable to expert manual design with 10/spl times/ fewer candidate solution evaluations than previously published approaches that rely on traditional stochastic optimization methods.
Keywords :
SPICE; analogue integrated circuits; application specific integrated circuits; circuit CAD; circuit optimisation; circuit simulation; integrated circuit design; network topology; ASF; analog IP; cell-level simulation; circuit topology; custom analog circuit synthesis; design automation; downhill technique; numerical optimization; schematic and SPICE methodology; schematic capture design; stochastic search; system-on-chip; Automatic control; Circuit simulation; Circuit synthesis; Circuit topology; Design automation; Integrated circuit technology; Manufacturing automation; Manufacturing processes; Stochastic processes; Time to market;
Conference_Titel :
Computer Aided Design, 2001. ICCAD 2001. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-7803-7247-6
DOI :
10.1109/ICCAD.2001.968646