Title :
A Coupled Electrical-Mechanical-Thermal Analysis of EHV Disconnecting Switch for Short Circuit Current Condition
Author :
Oh, Y.H. ; Song, K.D. ; Lee, W.Y. ; Hahn, S.C.
Author_Institution :
Korea Electrotechnol. Res. Inst., Changwon
Abstract :
This paper presents the performance prediction technique of a disconnecting switch in case of short circuit current conduction. The thermal characteristics caused by the applied force to the contacts and contact resistance are analyzed by solving a coupled electrical-mechanical-thermal problem
Keywords :
short-circuit currents; switchgear; thermal analysis; EHV disconnecting switch; contact resistance; coupled electrical-mechanical-thermal analysis; short circuit current conduction; Circuit testing; Contact resistance; Coupling circuits; Electrical resistance measurement; Performance analysis; Short circuit currents; Switches; Switching circuits; Temperature; Thermal force;
Conference_Titel :
Electromagnetic Field Computation, 2006 12th Biennial IEEE Conference on
Conference_Location :
Miami, FL
Print_ISBN :
1-4244-0320-0
DOI :
10.1109/CEFC-06.2006.1632830
