Title :
Oxide-Induced Noise in Carbon Nanotube Devices
Author :
Lin, Yu-Ming ; Avouris, Phaedon
Author_Institution :
IBM, Yorktown Heights
Abstract :
In this report, we employ suspended nanotubes to directly study the impact of the oxide on the electrical properties and noise characteristics of carbon nanotube devices, showing that the 1/f noise can be reduced significantly in a substrate-free environment.
Keywords :
1/f noise; carbon nanotubes; nanotube devices; semiconductor nanotubes; 1/f noise; C; carbon nanotube devices; device fabrication; device optimization; nanoelectronic circuits; nanoelectronic devices; oxide-induced noise; Carbon nanotubes; Electrodes; Etching; Fluctuations; Nanotube devices; Noise level; Noise reduction; Semiconductor device noise; Substrates; Working environment noise;
Conference_Titel :
Device Research Conference, 2007 65th Annual
Conference_Location :
Notre Dame, IN
Print_ISBN :
978-1-4244-1101-6
Electronic_ISBN :
1548-3770
DOI :
10.1109/DRC.2007.4373687
