Title :
Fabrication and characterization of nano-scale lines through anodic porous alumina membrane
Author :
Han, Guo Q. ; Jiang, Zhuang D. ; Jing, Wei X. ; Wang, Hai R. ; Sun, Guo L. ; Zhu, Ming Z.
Author_Institution :
State Key Lab. for Manuf. Syst. Eng., Xi´´an
Abstract :
Anodic Porous alumina membranes are fabricated with different pore sizes through second oxide technique by changing the acid electrolyte and the anodization voltage. The pore diameter value and interpore distance are evaluated through SEM images. Nanostructure patterns with nanometer scale lines can be obtained on the cleaved cross-section of porous alumina membrane. Nano CD (NCD) linewidth standard product lines are prepared in this way. The linewidth roughness (LWR) and line edge roughness (LER) have been evaluated by analyzing top-down scanning electron microscope (SEM) images off-line using image processing and analysis technology. The average linewidth is less than 40 nm and the LWR and LER are estimated.
Keywords :
alumina; anodisation; electrolytes; image processing; nanofabrication; nanostructured materials; porosity; porous materials; scanning electron microscopy; Al2O3; NCD linewidth standard product lines; SEM images; acid electrolyte; anodic porous alumina membrane fabrication; anodization voltage; image processing; interpore distance evaluation; line edge roughness; line width roughness; nano CD linewidth; nanoscale lines characterization; nanostructured pattern; pore diameter value; pore size; second oxide technique; top-down scanning electron microscope; Biomembranes; Fabrication; Image analysis; Image processing; Laboratories; Lithography; Metrology; Optical microscopy; Scanning electron microscopy; Systems engineering and theory; Anodic Porous Alumina; Image Analysis; Line Edge Rroughness; Llinewidth; Scanning Eelectrochemical Microscopy (SEM);
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2009. NEMS 2009. 4th IEEE International Conference on
Conference_Location :
Shenzhen
Print_ISBN :
978-1-4244-4629-2
Electronic_ISBN :
978-1-4244-4630-8
DOI :
10.1109/NEMS.2009.5068680