• DocumentCode
    1959363
  • Title

    Talk about the protection of intellectual property rights of industrial design in China from the phenomenon of “shanzhai”

  • Author

    Xuesong, Yang ; Weijie, Zeng

  • Author_Institution
    Urban Design Inst., Wuhan Univ., Wuhan, China
  • Volume
    2
  • fYear
    2010
  • fDate
    17-19 Nov. 2010
  • Firstpage
    955
  • Lastpage
    958
  • Abstract
    The development of China´s industrial design, must take the protection of intellectual property rights as strong backing, to get development by protection. But since 2008 fiercer phenomenon of“shanzhai” absolutely revealed the defects of China´s intellectual property rights protection system of industrial design. The“shanzhai” phenomenon, superficially comes from low costs to high profits and consumer´s excessive pursuit to cost performance, and essentially reflects Chinese manufacturing industry is in a transition period. On the mean time, it shows more brightly that the China´s industrial design system of intellectual property protection is still very weak. Based on the current situation of China´s industrial design, through three aspects of the state, enterprises, individuals respectively, take relevant measures such as perfecting the auditing system of intellectual property rights, intensifying infringement punishment and supervision, establishing specialized management department in enterprise, strengthening the awareness of intellectual property rights protection, to build a good social environment, so as to promote the enthusiasm of stylists and the development of China´s industrial design.
  • Keywords
    design engineering; industrial property; China; industrial design; infringement punishment; intellectual property rights protection; shanzhai phenomenon; Companies; Economics; Industrial Design; Intellectual property rights protection; cost performance; innovation; shanzhai;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Industrial Design & Conceptual Design (CAIDCD), 2010 IEEE 11th International Conference on
  • Conference_Location
    Yiwu
  • Print_ISBN
    978-1-4244-7973-3
  • Type

    conf

  • DOI
    10.1109/CAIDCD.2010.5681814
  • Filename
    5681814