DocumentCode
1959423
Title
Faster SAT and smaller BDDs via common function structure
Author
Aloul, F.A. ; Markov, I.L. ; Sakallah, K.A.
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
fYear
2001
fDate
4-8 Nov. 2001
Firstpage
443
Lastpage
448
Abstract
The increasing popularity of SAT and BDD techniques in verification and synthesis encourages the search for additional speed-ups. Since typical SAT and BDD algorithms are exponential in the worst-case, the structure of real-world instances is a natural source of improvements. While SAT and BDD techniques are often presented as mutually exclusive alternatives, our work points out that both can be improved via the use of the same structural properties of instances. Our proposed methods are based on efficient problem partitioning and can be easily applied as pre-processing with arbitrary SAT solvers and BDD packages without source code modifications. Our contribution is validated on the ISCAS circuits and the DIMACS benchmarks. Empirically, our technique often outperforms existing techniques by a factor of two or more. Our results motivate search for stronger dynamic ordering heuristics and combined static/dynamic techniques.
Keywords
Boolean functions; automatic test pattern generation; binary decision diagrams; circuit CAD; formal verification; logic CAD; network routing; ATPG; BDD techniques; Boolean formula preprocessing; EDA; SAT techniques; binary decision diagrams; common function structure; complete Boolean satisfiability solvers; computer-aided design; conjunctive normal form; efficient problem partitioning; electronic design automation; formal verification; hypergraph placement; routing; synthesis; timing verification; universal variable-ordering MINCE; Binary decision diagrams; Boolean functions; Circuits; Computer science; Data structures; Heuristic algorithms; Manipulator dynamics; Packaging; Partitioning algorithms; Runtime;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Aided Design, 2001. ICCAD 2001. IEEE/ACM International Conference on
Conference_Location
San Jose, CA, USA
ISSN
1092-3152
Print_ISBN
0-7803-7247-6
Type
conf
DOI
10.1109/ICCAD.2001.968669
Filename
968669
Link To Document