DocumentCode :
1959479
Title :
Raman descrimination of Helicobacter pylori fingerprint in dielectrophoresis chip
Author :
Lin, Chi-Chang ; Yang, Ying-Mei ; Chang, Hsien-Chang
Author_Institution :
Inst. of Biomed. Eng., Nat. Cheng Kung Univ., Tainan
fYear :
2009
fDate :
5-8 Jan. 2009
Firstpage :
793
Lastpage :
796
Abstract :
A rapid trapping and detection method for clinical bacteria (Helicobacter pylori, H. pylori) analysis is designed and reported in this study. Different strain of H. pylori can be trapped in 3 dimension dielectrophoresis chip (DEP) under the condition of 20 mM PBS, voltage at 20 Vp-p and frequency at 300 kHz. H. pylori #238(Wild type) presents more and stronger functional group stretching and vibration in Raman spectra than that of H. pylori #603(gene knockout). In clinical specimen analysis, significant difference between Duodenal Ulcer (DU, n=6) and Gastric Cancer (GC, n=4) are observed and showed the 70% and 80% of correction rate with clinical analysis results by PCA and HCA analysis. The DEP chip with rapid identification function is successful achieved and the fingerprint of H. pylori can be in situ detected and obtained in 3 min.
Keywords :
Raman spectroscopy; bio-optics; biomedical measurement; cancer; electrophoresis; lab-on-a-chip; microorganisms; tumours; 3 dimension dielectrophoresis chip; DEP chips; H. pylori strain; HCA analysis; Helicobacter pylori fingerprint; Raman scattering technique; Raman spectroscopy; clinical bacteria analysis; clinical specimen analysis; dielectrophoresis chip; duodenal ulcer; gastric cancer; in situ detection; rapid detection method; rapid identification function; rapid trapping method; Cancer; Capacitive sensors; Design engineering; Dielectrophoresis; Electrodes; Fingerprint recognition; Microorganisms; Principal component analysis; Raman scattering; Voltage; Helicobactor pylori; Raman; dielectrophoretic; fingerprint;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nano/Micro Engineered and Molecular Systems, 2009. NEMS 2009. 4th IEEE International Conference on
Conference_Location :
Shenzhen
Print_ISBN :
978-1-4244-4629-2
Electronic_ISBN :
978-1-4244-4630-8
Type :
conf
DOI :
10.1109/NEMS.2009.5068697
Filename :
5068697
Link To Document :
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