Automated Internet measurement laboratory (AIM/Lab) for engineering education

Author

Fjeldly, T.A. ; Shur, M.S. ; Shen, H. ; Ytterdal, T.

Author_Institution

Rensselaer Polytech. Inst., Troy, NY, USA

Volume

1

fYear

1999

fDate

10-13 Nov. 1999

Abstract

We report on the development of AIM-Lab, a remote characterization laboratory for characterization of electronic devices over the Internet. Specifically, we apply the AIM-Lab concept in a senior/graduate course on semiconductor devices and circuits. AIM-Lab has been used in the distance learning programs at Rensselaer Polytechnic Institute (RPI) and at the Norwegian University of Science and Technology (NTNU).

Keywords

Internet; computer aided instruction; distance learning; electronic engineering education; semiconductor device measurement; student experiments; AIM/Lab; Norwegian University of Science and Technology; Rensselaer Polytechnic Institute; automated Internet measurement laboratory; distance learning programs; electronic devices characterisation; engineering education; remote characterization laborator; semiconductor circuits; semiconductor devices; senior/graduate course; Analytical models; Circuit simulation; Circuit testing; Educational technology; Engineering education; Instruments; Internet; Remote laboratories; Silicon carbide; Web server;

fLanguage

English

Publisher

ieee

Conference_Titel

Frontiers in Education Conference, 1999. FIE '99. 29th Annual

Conference_Location

San Juan, Puerto Rico

ISSN

0190-5848

Print_ISBN

0-7803-5643-8

Type

conf

DOI

10.1109/FIE.1999.839260

Filename

839260