Title :
The Evaluation of Alumina Substrates for use in Microstrip Microwave Integrated Circuits
Author_Institution :
Ph.D research at University College, London.
Keywords :
Circuit testing; Frequency; Loss measurement; Manufacturing; Microstrip; Microwave integrated circuits; Q factor; Q measurement; Resonance; Wavelength measurement;
Conference_Titel :
Microwave Conference, 1969. 1st European
Conference_Location :
London, UK
DOI :
10.1109/EUMA.1969.331898