Title :
Microwave Integrated Devices and Subsystems on Ferrite Substrates
Author_Institution :
Philips Zentral - laboratorium GmbH Hamburg, Germany
Keywords :
Dielectric constant; Dielectric loss measurement; Dielectric substrates; Ferrites; Frequency; Gunn devices; Microstrip; Microwave devices; Microwave oscillators; Wavelength measurement;
Conference_Titel :
Microwave Conference, 1969. 1st European
Conference_Location :
London, UK
DOI :
10.1109/EUMA.1969.331899