Title :
Electron Beam Sensing of Surface Elastic Waves for Signal Processing Purposes
Author :
Joshi, S.G. ; Epstein, M. ; Serafin, R.J. ; van den Heuvel, A.P.
Author_Institution :
Electronics Division, IIT Research Institute, Chicago, Illinois, U.S.A.
Keywords :
Electron beams; Electron emission; Lithium niobate; Magnetic separation; Magnetoelasticity; Magnetostatic waves; Scanning electron microscopy; Signal processing; Surface waves; Voltage;
Conference_Titel :
Microwave Conference, 1969. 1st European
Conference_Location :
London, UK
DOI :
10.1109/EUMA.1969.331906