Title :
An Improved Rayleigh-Ritz Procedure for Determination of Stripline Parameters
Author :
Vander Vorst, A. ; Laloux, A.
Author_Institution :
Microwave Laboratory, Catholic University of Louvain, Belgium.
Keywords :
Capacitance; Capacitance-voltage characteristics; Dielectric constant; Dielectric losses; Equations; Filling; Fourier transforms; Impedance; Stripline; Strips;
Conference_Titel :
Microwave Conference, 1969. 1st European
Conference_Location :
London, UK
DOI :
10.1109/EUMA.1969.331971
