Compact, all-diode-laser, optical frequency reference based on laser-trapped atomic calcium

Author

Oates, C.W. ; Stephens, M. ; Hollberg, L.W.

Author_Institution

Time & Frequency Div., Nat. Inst. of Stand. & Technol., Boulder, CO, USA

fYear

1997

fDate

11-13 Aug. 1997

Firstpage

42

Lastpage

43

Abstract

An important application of diode lasers in the standards community is the development of the next generation of frequency/wavelength references, where semiconductor laser technology will enable higher performance in portable, inexpensive, and reliable systems. At NIST we are working on an all-diode-laser, optical frequency reference based on the /sup 1/S/sub 0/-/sup 3/P/sub 1/ intercombination line in Ca at 657 nm. This transition is one of those recommended for the realization of the meter, and its absolute frequency has been measured with an uncertainty of 450 Hz, the most precise of any visible reference.

Keywords

calcium; laser frequency stability; laser reliability; laser transitions; measurement errors; measurement standards; radiation pressure; semiconductor lasers; /sup 1/S/sub 0/-/sup 3/P/sub 1/ intercombination line; 657 nm; Ca; NIST; absolute frequency; all-diode-laser optical frequency reference; compact all-diode-laser optical frequency reference; frequency/wavelength references; laser-trapped atomic calcium; measurement uncertainty; optical frequency reference; reliable systems; semiconductor laser technology; standards community; visible reference; Atom lasers; Atom optics; Atomic beams; Calcium; Diode lasers; Frequency; Laser tuning; Optical feedback; Optical filters; Spectroscopy;

fLanguage

English

Publisher

ieee

Conference_Titel

Vertical-Cavity Lasers, Technologies for a Global Information Infrastructure, WDM Components Technology, Advanced Semiconductor Lasers and Applications, Gallium Nitride Materials, Processing, and Devi

Conference_Location

Montreal, Que., Canada

Print_ISBN

0-7803-3891-X

Type

conf

DOI

10.1109/LEOSST.1997.619212

Filename

619212