• DocumentCode
    1960357
  • Title

    Studies Of Frequency Dependent C-V Characteristics Of Neutron Irradiated P+-n Silicon Detectors

  • Author

    Li, Zheng ; Kraner, H.W.

  • Author_Institution
    Brookhaven National Laboratory
  • fYear
    1990
  • fDate
    22-27 Oct 1990
  • Firstpage
    854
  • Lastpage
    860
  • Keywords
    Capacitance; Capacitance-voltage characteristics; Conductivity; Detectors; Electron traps; Frequency dependence; Neutrons; Semiconductor process modeling; Silicon; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium, 1990. Conference record : Including Sessions on Nuclear Power Systems and Medical Imaging Conference, 1990 IEEE
  • Print_ISBN
    0-87942-683-7
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1990.693473
  • Filename
    693473
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1960357