Title :
The contribution of contact in non-linearity of CV characteristic of thick film resistor
Author :
Pelikánová, Ivana Beshajová
Author_Institution :
Dept. of Electrotechnol., CTU in Prague, Prague, Czech Republic
Abstract :
The work deals with thick film resistors and their properties. The structures of resistive and conductive thick film layers were prepared by screen-printing by polymer thick film pastes. Samples were exposed to accelerated ageing in environment with enhanced temperature and humidity. Tested sample consist of thick film resistors with different width and length. The non-linearity of current-voltage characteristic of resistors was measured. The measured resistor include not only resistive layer but also interface between conductive and resistive layers. The influence such interface is analyzed.
Keywords :
ageing; humidity; polymer films; thick film resistors; CV characteristic nonlinearity; accelerated ageing; conductive layer; conductive thick film layers structure; contact contribution; current-voltage characteristic; enhanced temperature; humidity; measured resistor; polymer thick film pastes; resistive layer; resistive thick film layers structure; screen-printing; thick film resistors; Aging; Harmonic analysis; Humidity; Resistance; Resistors; Thick films; Voltage measurement;
Conference_Titel :
Electronics Technology (ISSE), 2011 34th International Spring Seminar on
Conference_Location :
Tratanska Lomnica
Print_ISBN :
978-1-4577-2111-3
DOI :
10.1109/ISSE.2011.6053882
