• DocumentCode
    1960492
  • Title

    Scratch of submicron grooves on aluminum film with AFM diamond tip

  • Author

    Peng, Ping ; Shi, Tielin ; Liao, Guanglan ; Tang, Zirong ; Liu, Chang

  • Author_Institution
    Wuhan Nat. Lab. for Optoelectron., Wuhan
  • fYear
    2009
  • fDate
    5-8 Jan. 2009
  • Firstpage
    983
  • Lastpage
    986
  • Abstract
    In this paper nanomachining on aluminum film using an atomic force microscope (AFM) with commercial diamond tip is investigated. To obtain nano scale groove structure, experiments of nanomachining on aluminum films under various machining conditions were conducted. Then the cross sections of the grooves were measured by AFM, which indicates that using diamond tip, deep grooves on the aluminum film can be made easily. The experimental results also show that the material properties of the coating/substrate are elastic-plastic nearly following a bilinear law with isotropic strain hardening. By penetrating the aluminum film, the submicron grooves are produced on the aluminum film and silicon substrate. As aluminum film is a good mask for etching silicon and silica, it provides a low cost nano fabrication technique compared to traditional nano photolithography, and has a good prospect in nano imprint template fabrication and high end photomask repair.
  • Keywords
    aluminium; atomic force microscopy; metallic thin films; micromachining; nanotechnology; Al; aluminum film; atomic force microscopy; etching; isotropic strain hardening; nano scale groove structure; nanomachining; submicron grooves scratch; Aluminum; Atomic force microscopy; Atomic measurements; Conductive films; Fabrication; Machining; Nanostructures; Semiconductor films; Silicon; Substrates; AFM; nanomachining; scratch; submicron grooves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems, 2009. NEMS 2009. 4th IEEE International Conference on
  • Conference_Location
    Shenzhen
  • Print_ISBN
    978-1-4244-4629-2
  • Electronic_ISBN
    978-1-4244-4630-8
  • Type

    conf

  • DOI
    10.1109/NEMS.2009.5068738
  • Filename
    5068738