DocumentCode
1960492
Title
Scratch of submicron grooves on aluminum film with AFM diamond tip
Author
Peng, Ping ; Shi, Tielin ; Liao, Guanglan ; Tang, Zirong ; Liu, Chang
Author_Institution
Wuhan Nat. Lab. for Optoelectron., Wuhan
fYear
2009
fDate
5-8 Jan. 2009
Firstpage
983
Lastpage
986
Abstract
In this paper nanomachining on aluminum film using an atomic force microscope (AFM) with commercial diamond tip is investigated. To obtain nano scale groove structure, experiments of nanomachining on aluminum films under various machining conditions were conducted. Then the cross sections of the grooves were measured by AFM, which indicates that using diamond tip, deep grooves on the aluminum film can be made easily. The experimental results also show that the material properties of the coating/substrate are elastic-plastic nearly following a bilinear law with isotropic strain hardening. By penetrating the aluminum film, the submicron grooves are produced on the aluminum film and silicon substrate. As aluminum film is a good mask for etching silicon and silica, it provides a low cost nano fabrication technique compared to traditional nano photolithography, and has a good prospect in nano imprint template fabrication and high end photomask repair.
Keywords
aluminium; atomic force microscopy; metallic thin films; micromachining; nanotechnology; Al; aluminum film; atomic force microscopy; etching; isotropic strain hardening; nano scale groove structure; nanomachining; submicron grooves scratch; Aluminum; Atomic force microscopy; Atomic measurements; Conductive films; Fabrication; Machining; Nanostructures; Semiconductor films; Silicon; Substrates; AFM; nanomachining; scratch; submicron grooves;
fLanguage
English
Publisher
ieee
Conference_Titel
Nano/Micro Engineered and Molecular Systems, 2009. NEMS 2009. 4th IEEE International Conference on
Conference_Location
Shenzhen
Print_ISBN
978-1-4244-4629-2
Electronic_ISBN
978-1-4244-4630-8
Type
conf
DOI
10.1109/NEMS.2009.5068738
Filename
5068738
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