Measurement of microwave properties of X-band accelerating structure under pulsed high-power operation at liquid nitrogen temperature

Author

Saversky, A.J. ; Shchedrin, I.S.

Author_Institution

Moscow Eng. Phys. Inst., Russia

fYear

1993

fDate

17-20 May 1993

Firstpage

1030

Abstract

After required chemical treatments a disk-loading structure was operated at liquid nitrogen temperature with X-band magnetron as an RF source. The peak RF pulse power was variable from 150 to 300 KW and the average power was altered by changing the pulse repetition rate between 1400 and 2800 pps. Measurements on this structure both at low and at high power indicated the Q factor of 6800 at room temperature,which increased to 17000. At liquid nitrogen temperature-an enhancement factor greater then 2,5 in good agreement with theory

Keywords

Q-factor; beam handling equipment; linear accelerators; low-temperature techniques; magnetrons; 150 to 300 kW; Q factor; RF source; X-band accelerating structure; X-band magnetron; average power; chemical treatments; disk-loading structure; enhancement factor; liquid N₂ temperature; microwave properties; peak RF pulse power; pulse repetition rate; pulsed high-power operation; Acceleration; Copper; Microwave measurements; Nitrogen; Pulse measurements; Radio frequency; Reflection; Surface resistance; Surface treatment; Temperature dependence;

fLanguage

English

Publisher

ieee

Conference_Titel

Particle Accelerator Conference, 1993., Proceedings of the 1993

Conference_Location

Washington, DC

Print_ISBN

0-7803-1203-1

Type

conf

DOI

10.1109/PAC.1993.308693

Filename

308693