DocumentCode :
1961561
Title :
A Rationale for Pursuing EIT and MREIT in 3-D Based on Weyl Asymptotics and Problem Conditioning
Author :
Kotiuga, P. Robert
Author_Institution :
Dept. of Electr. & Comput. Eng., Boston Univ., MA
fYear :
0
fDate :
0-0 0
Firstpage :
162
Lastpage :
162
Abstract :
Weyl asymptotics are used to demonstrate that the conditioning of electrical impedance tomography improves with dimension. The analysis shows that the practical difficulties of collecting data in 3-d should not deter one from expecting good reconstructions
Keywords :
electric impedance imaging; EIT; MREIT; Weyl asymptotics; electrical impedance tomography; magnetic resonance assisted EIT; problem conditioning; Boundary conditions; Conductivity; Conductors; Eigenvalues and eigenfunctions; Electromagnetic radiation; Image reconstruction; Impedance; Magnetic analysis; Neodymium; Tomography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Field Computation, 2006 12th Biennial IEEE Conference on
Conference_Location :
Miami, FL
Print_ISBN :
1-4244-0320-0
Type :
conf
DOI :
10.1109/CEFC-06.2006.1632954
Filename :
1632954
Link To Document :
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