• DocumentCode
    1961634
  • Title

    Fine-scale analysis of gain-coupled MQW DFB lasers

  • Author

    Champagne, A. ; Jianyao Chen ; Maciejko, R. ; Makino, T.

  • Author_Institution
    Dept. of Eng. Phys., Ecole Polytech., Montreal, Que., Canada
  • fYear
    1997
  • fDate
    11-13 Aug. 1997
  • Firstpage
    55
  • Lastpage
    56
  • Abstract
    In gain-coupled (GC) multiple-quantum-well (MQW) distributed feedback (DFB) lasers, phenomena on the submicron scale corresponding to quantum-well active regions with etched Bragg gratings have been shown to affect overall laser performance. In this paper we present results combining submicron bi-dimensional modeling with a fine-scale longitudinal transfer matrix calculation, above threshold. This has the benefit of considering both the detailed bi-dimensional carrier behaviour at the Bragg-wavelength scale and the larger scale DFB effects such as the longitudinal spatial hole burning and the non-uniform current injection along the the laser cavity.
  • Keywords
    diffraction gratings; distributed feedback lasers; laser cavity resonators; laser theory; optical couplers; quantum well lasers; semiconductor device models; Bragg-wavelength scale; bi-dimensional carrier behaviour; etched Bragg gratings; fine-scale analysis; fine-scale longitudinal transfer matrix; gain-coupled MQW DFB lasers; larger scale DFB effects; laser cavity; longitudinal spatial hole burning; multiple-quantum-well distributed feedback lasers; non-uniform current injection; overall laser performance; quantum-well active regions; submicron bi-dimensional modeling; submicron scale; Charge carrier density; Distributed feedback devices; Etching; Gratings; Laboratories; Laser feedback; Laser modes; Laser theory; Quantum well devices; Quantum well lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vertical-Cavity Lasers, Technologies for a Global Information Infrastructure, WDM Components Technology, Advanced Semiconductor Lasers and Applications, Gallium Nitride Materials, Processing, and Devi
  • Conference_Location
    Montreal, Que., Canada
  • Print_ISBN
    0-7803-3891-X
  • Type

    conf

  • DOI
    10.1109/LEOSST.1997.619218
  • Filename
    619218