Photostable Single KTiOPO4 Nanocrystals for Second-Harmonic Generation Microscopy

Author

Le Xuan, L. ; Zhou, C. ; Slablab, A. ; Chauvat, D. ; Sandeau, N. ; Brasselet, S. ; Roch, J.F. ; Tard, C. ; Perruchas, S. ; Gacoin, T. ; Villeval, P.

Author_Institution

ENS Cachan, Cachan

fYear

2007

fDate

Aug. 12 2007-July 16 2007

Firstpage

39

Lastpage

40

Abstract

The finding of nonlinear nanometric-sized probes is of key importance for the development of nonlinear microscopy in nanosciences and biology. We isolate nonlinear KTiOPO₄ nanocrystals with remarkable photostability in second-harmonic generation under femtosecond infrared laser light excitation. Their size distribution is determined using dynamic light scattering and atomic force microscopy. With both polarization analysis and defocused imaging of the emitted second-harmonic field, we also extract the Euler angles of the crystalline axes of a single nanocrystal. These sub-wavelength particles can find application as near-field vectorial probes.

Keywords

atomic force microscopy; high-speed optical techniques; light polarisation; light scattering; nanostructured materials; optical harmonic generation; optical materials; optical microscopy; potassium compounds; Euler angles; KTP; KTP - System; atomic force microscopy; defocused imaging; dynamic light scattering; femtosecond infrared laser light excitation; near-field vectorial probes; nonlinear microscopy; nonlinear nanocrystals; nonlinear nanometric-sized probes; photostability; photostable single nanocrystals; polarization analysis; second-harmonic field imaging; second-harmonic generation microscopy; size distribution; subwavelength particles; Atomic beams; Atomic force microscopy; Image analysis; Laser excitation; Light scattering; Nanobioscience; Nanocrystals; Optical imaging; Optical polarization; Probes; nanocrystal; nonlinear microscopy; second harmonic generation;

fLanguage

English

Publisher

ieee

Conference_Titel

Optical MEMS and Nanophotonics, 2007 IEEE/LEOS International Conference on

Conference_Location

Hualien

Print_ISBN

978-1-4244-0641-8

Type

conf

DOI

10.1109/OMEMS.2007.4373829

Filename

4373829