DocumentCode :
1961725
Title :
Photostable Single KTiOPO4 Nanocrystals for Second-Harmonic Generation Microscopy
Author :
Le Xuan, L. ; Zhou, C. ; Slablab, A. ; Chauvat, D. ; Sandeau, N. ; Brasselet, S. ; Roch, J.F. ; Tard, C. ; Perruchas, S. ; Gacoin, T. ; Villeval, P.
Author_Institution :
ENS Cachan, Cachan
fYear :
2007
fDate :
Aug. 12 2007-July 16 2007
Firstpage :
39
Lastpage :
40
Abstract :
The finding of nonlinear nanometric-sized probes is of key importance for the development of nonlinear microscopy in nanosciences and biology. We isolate nonlinear KTiOPO4 nanocrystals with remarkable photostability in second-harmonic generation under femtosecond infrared laser light excitation. Their size distribution is determined using dynamic light scattering and atomic force microscopy. With both polarization analysis and defocused imaging of the emitted second-harmonic field, we also extract the Euler angles of the crystalline axes of a single nanocrystal. These sub-wavelength particles can find application as near-field vectorial probes.
Keywords :
atomic force microscopy; high-speed optical techniques; light polarisation; light scattering; nanostructured materials; optical harmonic generation; optical materials; optical microscopy; potassium compounds; Euler angles; KTP; KTP - System; atomic force microscopy; defocused imaging; dynamic light scattering; femtosecond infrared laser light excitation; near-field vectorial probes; nonlinear microscopy; nonlinear nanocrystals; nonlinear nanometric-sized probes; photostability; photostable single nanocrystals; polarization analysis; second-harmonic field imaging; second-harmonic generation microscopy; size distribution; subwavelength particles; Atomic beams; Atomic force microscopy; Image analysis; Laser excitation; Light scattering; Nanobioscience; Nanocrystals; Optical imaging; Optical polarization; Probes; nanocrystal; nonlinear microscopy; second harmonic generation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optical MEMS and Nanophotonics, 2007 IEEE/LEOS International Conference on
Conference_Location :
Hualien
Print_ISBN :
978-1-4244-0641-8
Type :
conf
DOI :
10.1109/OMEMS.2007.4373829
Filename :
4373829
Link To Document :
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