• DocumentCode
    1961768
  • Title

    Clock and data recovery circuits with fast acquisition and low jitter

  • Author

    Zhang, Ruiyuan ; Rue, George S La

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Washington State Univ., Pullman, WA, USA
  • fYear
    2003
  • fDate
    30 June-2 July 2003
  • Firstpage
    82
  • Lastpage
    85
  • Abstract
    This paper presents a half-rate clock and data recovery circuit (CDR) that combines the best features, fast acquisition and low jitter, of digital phase selection and phase-lock-loop (PLL) CDR circuits. This CDR circuit consists of a phase selector, which can lock to the data in just a few clock cycles but has high jitter, and a PLL, which requires a much longer lock time but provides a low-jitter clock after locking. Simulations in 1/2 micrometer CMOS technology show operation up to 800 Mbps, a 6% acquisition range, an initial acquisition time of 4 bit times with 211 ps rms jitter, and jitter of 7.5 ps after a PLL lock time of 650 ns. A phase-frequency magnitude detector (PFMD) is added to the combined CDR to improve the lock time by feeding back an estimate of the magnitude of the frequency offset in addition to the sign. Simulations show that the 650 ns lock time is reduced by about a factor of 4 to under 200 ns from an initial 6% frequency difference.
  • Keywords
    CMOS digital integrated circuits; clocks; digital phase locked loops; recovery; timing jitter; 200 ns; 211 ps; 650 ns; 7.5 ps; CMOS technology; PLL lock time; clock circuits; clock cycles; data recovery circuits; fast acquisition; frequency offset feeding back; longer lock time; low jitter; phase-frequency magnitude detector; phase-lock-loop; Bit error rate; CMOS technology; Circuit simulation; Clocks; Computer science; Frequency estimation; Jitter; Phase detection; Phase frequency detector; Phase locked loops;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    University/Government/Industry Microelectronics Symposium, 2003. Proceedings of the 15th Biennial
  • ISSN
    0749-6877
  • Print_ISBN
    0-7803-7972-1
  • Type

    conf

  • DOI
    10.1109/UGIM.2003.1225702
  • Filename
    1225702