Title :
Two Computer-Aided Microwave Experiments
Author :
Kendall, B.R. ; Hutchins, S. ; Comeau, J. ; Angelakos, D.J.
Author_Institution :
Electronics Research Laboratory, U.C., Berkeley.
Keywords :
Acoustic noise; Computer displays; Frequency; Low-frequency noise; Microwave devices; Phase measurement; Rough surfaces; Scattering; Signal detection; Surface roughness;
Conference_Titel :
Microwave Conference, 1969. 1st European
Conference_Location :
London, UK
DOI :
10.1109/EUMA.1969.331930
