DocumentCode :
1961832
Title :
Microscopic investigation of RF surfaces of 3 GHz niobium accelerator cavities following RF processing
Author :
Graber, J. ; Barnes, P. ; Flynn, T. ; Kirchgessner, J. ; Knobloch, J. ; Moffat, D. ; Muller, H. ; Padamsee, H. ; Sears, J.
Author_Institution :
Newman Lab. of Nucl. Studies, Cornell Univ., Ithaca, NY, USA
fYear :
1993
fDate :
17-20 May 1993
Firstpage :
889
Abstract :
RF processing of superconducting accelerating cavities is achieved through a change in the electron field emission (FE) characteristics of the RF surface. We have examined the RF surfaces of several single-cell 3 GHz cavities, following RF processing, in a scanning electron microscope (SEM). The RF processing sessions included both high peak power (P⩽50 kW) pulsed processing, and low power (⩽20 W) continuous wave processing. The experimental apparatus also included a thermometer array on the cavity outer wall, allowing temperature maps to characterize the emission before and after RF processing gains. Multiple sites have been located in cavities which showed improvements in cavity behavior due to RF processing. Several SEM-located sites can be correlated with changes in thermometer signals, indicating a direct relationship between the surface site and emission reduction due to RF processing. Information gained from the SEM investigations and thermometry are used to enhance the theoretical model of RF processing
Keywords :
beam handling equipment; cavity resonators; electron emission; electron field emission; niobium; scanning electron microscope examination of materials; superconducting microwave devices; temperature measurement; 20 W; 3 GHz; 50 kW; Nb; Nb accelerator cavities; RF processing; RF surfaces; SEM; continuous wave processing; electron field emission; high peak power; low power; pulsed processing; scanning electron microscopy; single-cell; superconducting accelerating cavities; thermometry; Acceleration; Electron emission; Iron; Laboratories; Niobium; Radio frequency; Scanning electron microscopy; Signal processing; Temperature; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Particle Accelerator Conference, 1993., Proceedings of the 1993
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-1203-1
Type :
conf
DOI :
10.1109/PAC.1993.308740
Filename :
308740
Link To Document :
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