• DocumentCode
    1962165
  • Title

    Testing of metal gate PMOS digital integrated circuits

  • Author

    Fuller, Lynn F. ; Hoomkwap, Kekuut ; Shakya, Sushil ; Yenrudee, Suebphong

  • Author_Institution
    Microelectron. Eng., Rochester Inst. of Technol., NY, USA
  • fYear
    2003
  • fDate
    30 June-2 July 2003
  • Firstpage
    170
  • Lastpage
    173
  • Abstract
    Many universities use the metal gate PMOS process for educational laboratory projects in the fabrication of integrated circuits. A semiconductor parameter analyzer is often used for testing the transistors, resistors and inverters on their test chips. The semiconductor parameter analyzer cannot be used for testing a digital circuit with a large number of inputs and outputs. A low cost digital circuit tester has been created using a personal computer and additional boards for output and input. Lab View software was used to create a graphical interface with the test system. The test system has been used to functionally test multiplexers, demultiplexers, full-adders and other digital integrated circuits. The test system generates a plot of input and output voltages versus time very similar to a digital circuit simulator output.
  • Keywords
    MOS digital integrated circuits; adders; demultiplexing; integrated circuit testing; laboratories; multiplexing; demultiplexers; digital circuit; digital circuit tester; educational laboratory projects; full-adders; graphical interface; inverters; metal gate PMOS digital integrated circuits; resistors; test chips; test multiplexers; transistors; Circuit testing; Digital circuits; Digital integrated circuits; Educational institutions; Fabrication; Integrated circuit testing; Laboratories; Resistors; Semiconductor device testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    University/Government/Industry Microelectronics Symposium, 2003. Proceedings of the 15th Biennial
  • ISSN
    0749-6877
  • Print_ISBN
    0-7803-7972-1
  • Type

    conf

  • DOI
    10.1109/UGIM.2003.1225720
  • Filename
    1225720