• DocumentCode
    1962175
  • Title

    NFTAPE: a framework for assessing dependability in distributed systems with lightweight fault injectors

  • Author

    Stott, David T. ; Floering, Benjamin ; Burke, Daniel ; Kalbarczpk, Z. ; Iyer, Ravishankar K.

  • Author_Institution
    Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    91
  • Lastpage
    100
  • Abstract
    Many fault injection tools are available for dependability assessment. Although these tools are good at injecting a single fault model into a single system, they suffer from two main limitations for use in distributed systems: (1) no single tool is sufficient for injecting all necessary fault models; (2) it is difficult to port these tools to new systems. NFTAPE, a tool for composing automated fault injection experiments from available lightweight fault injectors, triggers, monitors, and other components, helps to solve these problems. We have conducted experiments using NFTAPE with several types of lightweight fault injectors, including driver-based, debugger-based, target-specific, simulation-based, hardware-based, and performance-fault injections. Two example experiments are described in this paper. The first uses a hardware fault injector with a Myrinet LAN; the other uses a Software Implemented Fault Injection (SWIFI) fault injector to target a space-imaging application
  • Keywords
    distributed processing; fault tolerant computing; local area networks; performance evaluation; Myrinet LAN; NFTAPE; Software Implemented Fault Injection; dependability; dependability assessment; distributed systems; fault injection tools; fault injectors; hardware fault injector; lightweight fault injectors; performance-fault injections; Application software; Automatic control; Automatic testing; Debugging; Hardware; Local area networks; Propulsion; Read only memory; Software engineering; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Performance and Dependability Symposium, 2000. IPDS 2000. Proceedings. IEEE International
  • Conference_Location
    Chicago, IL
  • ISSN
    1087-2191
  • Print_ISBN
    0-7695-0553-8
  • Type

    conf

  • DOI
    10.1109/IPDS.2000.839467
  • Filename
    839467