DocumentCode
1962178
Title
Pull-in Analysis of Scanners Actuated by Electrostatic Vertical Combdrives
Author
Lee, Daesung ; Solgaard, Olav
Author_Institution
Stanford Univ., Stanford
fYear
2007
fDate
Aug. 12 2007-July 16 2007
Firstpage
85
Lastpage
86
Abstract
This paper presents an analysis of pull-in due to in-plane twist in MEMS scanners actuated by vertical combdrives with general comb gap arrangements and cross-sections. The analysis is based on a 2-DOF actuator with a single voltage control. A closed-form pull-in deflection angle expression is obtained by accurately modeling the capacitance between the movable and fixed combs. The analysis results are in good agreement with simulations, and allow optimization of scanner designs by combining pull-in deflection angle, capacitance maximum angle, and available torque.
Keywords
actuators; micro-optics; micromechanical devices; optical scanners; MEMS scanners; capacitance maximum angle; closed-form pull-in deflection angle; electrostatic vertical combdrives; general comb gap arrangement; in-plane twist; Actuators; Capacitance; Electrostatic analysis; Equations; Fasteners; Laboratories; Micromechanical devices; Springs; Torque; Voltage control; Pull-in; comb gap; in-plane twist; scanner; vertical combdrive;
fLanguage
English
Publisher
ieee
Conference_Titel
Optical MEMS and Nanophotonics, 2007 IEEE/LEOS International Conference on
Conference_Location
Hualien
Print_ISBN
978-1-4244-0641-8
Type
conf
DOI
10.1109/OMEMS.2007.4373852
Filename
4373852
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