Title :
Lineage tracing in a data warehousing system
Author :
Cui, Yingwei ; Widom, Jennifer
Author_Institution :
Dept. of Comput. Sci., Stanford Univ., CA, USA
Abstract :
Some commercial data warehousing systems support schema-level lineage tracing, or provide specialized drill-down and/or drill-through facilities for multi-dimensional warehouse views. Our lineage tracing system supports more fine-grained instance-level lineage tracing for arbitrarily complex relational views, including aggregation. At view definition time, our system automatically generates lineage tracing procedures and supporting auxiliary views. At lineage tracing time, the system applies the tracing procedures to the source tables and/or auxiliary views to obtain the lineage results and to illustrate the specific view data derivation process
Keywords :
data mining; data warehouses; aggregation; arbitrarily complex relational views; automatic auxiliary view generation; automatic lineage tracing procedure generation; data warehousing systems; fine-grained instance-level lineage tracing; lineage tracing time; source tables; view data derivation process; view definition time; Contracts; Data analysis; Data mining; Data warehouses; Electrical capacitance tomography; Military computing; Warehousing;
Conference_Titel :
Data Engineering, 2000. Proceedings. 16th International Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7695-0506-6
DOI :
10.1109/ICDE.2000.839493
