Title :
MEMS-based microspectrometers for infrared sensing
Author :
Musca, C.A. ; Antoszewski, J. ; Keating, A.J. ; Winchester, K.J. ; Silva, K. K M B D ; Nguyen, T. ; Dell, J.M. ; Faraone, L.
Author_Institution :
Univ. of Western Australia, Crawley
fDate :
Aug. 12 2007-July 16 2007
Abstract :
Micro-electro-mechanical systems (MEMS)-based tunable optical filters, integrated with an infrared detector, select narrow wavelength bands in either the short-wavelength infrared (SWIR), or the mid-wavelength infrared (MWIR) region of the electromagnetic spectrum. The SWIR microspectrometer is based on monolithic integration of a parallel plate MEMS optical filter with a HgCdTe-based infrared detector. The fabrication process for the MEMS Fabry-Perot filter and the integral HgCdTe detector is completed while maintaining the processing temperature less than 125degC, as the performance of HgCdTe based detectors degrades at higher temperatrues. The preliminary MWIR microspectrometer result was based on a hybrid approach, fabricating the filter separately from the HgCdTe detector, however the process temperature control were maintained during fabrication of the MWIR filter, ensuring migration of this technology into an integrated solution. A tuning range of 900 nm with linewidths of 210 nm have been achieved for the MWIR, while maintaining a relatively low tuning voltage of 17 V.
Keywords :
infrared detectors; infrared spectrometers; integrated optics; micro-optics; microsensors; optical filters; HgCdTe; HgCdTe-based infrared detector; MEMS Fabry-Perot filter; MWIR microspectrometer; SWIR microspectrometers; electromagnetic spectrum; infrared sensor; microelectro-mechanical systems; mid-wavelength infrared region; parallel plate MEMS optical filter; short-wavelength infrared region; temperature control; tunable optical filters; voltage 17 V; wavelength 210 nm; wavelength 900 nm; Electromagnetic spectrum; Fabry-Perot; Infrared detectors; Infrared spectra; Microelectromechanical systems; Micromechanical devices; Monolithic integrated circuits; Optical device fabrication; Optical filters; Temperature; HgCdTe; Optical MEMS; infrared; microspectrometer;
Conference_Titel :
Optical MEMS and Nanophotonics, 2007 IEEE/LEOS International Conference on
Conference_Location :
Hualien
Print_ISBN :
978-1-4244-0641-8
DOI :
10.1109/OMEMS.2007.4373878