DocumentCode
1962787
Title
In-situ performance monitor employing threshold based notifications (TheBaN)
Author
Gemmeke, T. ; Konijnenburg, Mario ; Bachmann, Christian
Author_Institution
Holst-Centre / imec, Eindhoven, Netherlands
fYear
2013
fDate
16-20 Sept. 2013
Firstpage
271
Lastpage
274
Abstract
In-situ performance monitoring offers significantly better voltage scaling potential than classic ring-oscillator based approaches as it eliminates the uncertainty due to local random variations. The major challenge of such an approach is the timely generation of signaling events to control the voltage level at the most energy efficient point still offering reliable operation. In this paper we present a novel threshold based notification scheme together with a detailed analysis of corner cases. The presented measurement results are based on an implementation in a digital signal processor in a 40nm low-power technology achieving an effective voltage margin as low as 5mV.
Keywords
low-power electronics; signal processing equipment; digital signal processor; in-situ performance monitor; low-power technology; size 40 nm; threshold based notifications; voltage scaling potential; Delays; Logic gates; Monitoring; Temperature measurement; Temperature sensors; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
ESSCIRC (ESSCIRC), 2013 Proceedings of the
Conference_Location
Bucharest
ISSN
1930-8833
Print_ISBN
978-1-4799-0643-7
Type
conf
DOI
10.1109/ESSCIRC.2013.6649125
Filename
6649125
Link To Document