• DocumentCode
    1962802
  • Title

    Thermal sensor microfabrication and related undergraduate research projects

  • Author

    Lawrence, David J. ; Hearn, S.L. ; Taylor, Gerald R., Jr.

  • Author_Institution
    Integrated Sci. & Technol. Program, James Madison Univ., Harrisonburg, VA, USA
  • fYear
    2003
  • fDate
    30 June-2 July 2003
  • Firstpage
    321
  • Lastpage
    324
  • Abstract
    We describe the microfabrication and characterization of thermopiles having up to 24 sensing junctions. Chromium-nickel devices were fabricated on glass substrates, and aluminum-silicon devices were processed on silicon wafers. Sensitivities as high as approximately 7 mV/□C were measured for the aluminum-silicon devices. The thermal mass of the sensing region of these devices was reduced by etching a well in the back surface of the silicon substrate, beneath the sensing junctions. The time constants of our fastest sensors were 33 ms. This work represents one example of undergraduate research carried out in our microfabrication laboratory. Other examples are also described, including solid state electrochromic devices, and silicon photovoltaic cells with textured surfaces, conventional metal grid contacts, and transparent conducting oxide contacts.
  • Keywords
    aluminium; chromium; elemental semiconductors; etching; nickel; semiconductor devices; sensitivity; sensors; silicon; thermopiles; 33 ms; Al-Si; Cr-Ni; Si; aluminum-silicon devices; chromium-nickel devices; conventional metal grid contacts; etching; glass substrates; sensitivity; silicon photovoltaic cells; silicon wafers; solid state electrochromic devices; textured surface; thermal mass; thermal sensor microfabrication; thermopiles; transparent conducting oxide contacts; Electrochromic devices; Etching; Glass; Laboratories; Photovoltaic cells; Sensor phenomena and characterization; Silicon; Solid state circuits; Surface texture; Thermal sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    University/Government/Industry Microelectronics Symposium, 2003. Proceedings of the 15th Biennial
  • ISSN
    0749-6877
  • Print_ISBN
    0-7803-7972-1
  • Type

    conf

  • DOI
    10.1109/UGIM.2003.1225753
  • Filename
    1225753