DocumentCode :
1962873
Title :
2×(4×)128 time-gated CMOS single photon avalanche diode line detector with 100 ps resolution for Raman spectroscopy
Author :
Nissinen, I. ; Lansman, Antti-Kalle ; Nissinen, J. ; Holma, J. ; Kostamovaara, J.
Author_Institution :
Dept. of Electr. Eng., Univ. of Oulu, Oulu, Finland
fYear :
2013
fDate :
16-20 Sept. 2013
Firstpage :
291
Lastpage :
294
Abstract :
A 2×(4×)128 multiphase time-gated single photon avalanche diode (SPAD) line detector has been designed and fabricated in a high voltage 0.35 μm CMOS technology for Raman spectroscopy. The time positions of the photons can be measured with the resolution of 100 ps using four time gates over the whole line detector simultaneously. This approach enables to reduce the fluorescence background of the Raman spectrum markedly. Measurements showed that the time gates can be distributed over the whole line detector with the accuracy of ± 35 ps which is adequate for a time-gated pulsed Raman spectroscopy using a laser pulse width of approximately 150 ps.
Keywords :
CMOS integrated circuits; Raman spectroscopy; avalanche diodes; CMOS single photon avalanche diode line detector; fluorescence background; laser pulse width; multiphase time-gated single photon avalanche diode; photons; size 0.35 mum; time 100 ps; time positions; time-gated pulsed Raman spectroscopy; whole line detector; Detectors; Fluorescence; Logic gates; Measurement by laser beam; Photonics; Radiation detectors; Raman scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ESSCIRC (ESSCIRC), 2013 Proceedings of the
Conference_Location :
Bucharest
ISSN :
1930-8833
Print_ISBN :
978-1-4799-0643-7
Type :
conf
DOI :
10.1109/ESSCIRC.2013.6649130
Filename :
6649130
Link To Document :
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