DocumentCode
1962873
Title
2×(4×)128 time-gated CMOS single photon avalanche diode line detector with 100 ps resolution for Raman spectroscopy
Author
Nissinen, I. ; Lansman, Antti-Kalle ; Nissinen, J. ; Holma, J. ; Kostamovaara, J.
Author_Institution
Dept. of Electr. Eng., Univ. of Oulu, Oulu, Finland
fYear
2013
fDate
16-20 Sept. 2013
Firstpage
291
Lastpage
294
Abstract
A 2×(4×)128 multiphase time-gated single photon avalanche diode (SPAD) line detector has been designed and fabricated in a high voltage 0.35 μm CMOS technology for Raman spectroscopy. The time positions of the photons can be measured with the resolution of 100 ps using four time gates over the whole line detector simultaneously. This approach enables to reduce the fluorescence background of the Raman spectrum markedly. Measurements showed that the time gates can be distributed over the whole line detector with the accuracy of ± 35 ps which is adequate for a time-gated pulsed Raman spectroscopy using a laser pulse width of approximately 150 ps.
Keywords
CMOS integrated circuits; Raman spectroscopy; avalanche diodes; CMOS single photon avalanche diode line detector; fluorescence background; laser pulse width; multiphase time-gated single photon avalanche diode; photons; size 0.35 mum; time 100 ps; time positions; time-gated pulsed Raman spectroscopy; whole line detector; Detectors; Fluorescence; Logic gates; Measurement by laser beam; Photonics; Radiation detectors; Raman scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
ESSCIRC (ESSCIRC), 2013 Proceedings of the
Conference_Location
Bucharest
ISSN
1930-8833
Print_ISBN
978-1-4799-0643-7
Type
conf
DOI
10.1109/ESSCIRC.2013.6649130
Filename
6649130
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