• DocumentCode
    1962873
  • Title

    2×(4×)128 time-gated CMOS single photon avalanche diode line detector with 100 ps resolution for Raman spectroscopy

  • Author

    Nissinen, I. ; Lansman, Antti-Kalle ; Nissinen, J. ; Holma, J. ; Kostamovaara, J.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Oulu, Oulu, Finland
  • fYear
    2013
  • fDate
    16-20 Sept. 2013
  • Firstpage
    291
  • Lastpage
    294
  • Abstract
    A 2×(4×)128 multiphase time-gated single photon avalanche diode (SPAD) line detector has been designed and fabricated in a high voltage 0.35 μm CMOS technology for Raman spectroscopy. The time positions of the photons can be measured with the resolution of 100 ps using four time gates over the whole line detector simultaneously. This approach enables to reduce the fluorescence background of the Raman spectrum markedly. Measurements showed that the time gates can be distributed over the whole line detector with the accuracy of ± 35 ps which is adequate for a time-gated pulsed Raman spectroscopy using a laser pulse width of approximately 150 ps.
  • Keywords
    CMOS integrated circuits; Raman spectroscopy; avalanche diodes; CMOS single photon avalanche diode line detector; fluorescence background; laser pulse width; multiphase time-gated single photon avalanche diode; photons; size 0.35 mum; time 100 ps; time positions; time-gated pulsed Raman spectroscopy; whole line detector; Detectors; Fluorescence; Logic gates; Measurement by laser beam; Photonics; Radiation detectors; Raman scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ESSCIRC (ESSCIRC), 2013 Proceedings of the
  • Conference_Location
    Bucharest
  • ISSN
    1930-8833
  • Print_ISBN
    978-1-4799-0643-7
  • Type

    conf

  • DOI
    10.1109/ESSCIRC.2013.6649130
  • Filename
    6649130