VCSEL based parallel optical interconnect reliability

Author

Lowes, T.D.

Author_Institution

W.L. Gore & Associates Inc., Lompoc, CA, USA

Volume

2

fYear

2001

fDate

2001

Firstpage

433

Abstract

Reliability of parallel optical interconnects (POI) is very critical because of the high cost of system down time. The high reliability standards established for telecom applications are even more challenging in a twelve wide array form factor. From a reliability viewpoint the limiting components are the optoelectronic devices. Reliability of the devices in the Gore nLIGHTEN^TM POI module is reviewed with emphasis being placed on the VCSEL transmitters

Keywords

laser reliability; optical interconnections; optical transmitters; semiconductor laser arrays; surface emitting lasers; Gore nLIGHTEN module; PIN photodetectors; VCSEL transmitters; acceleration factors; failure distribution; lifetime predictions; optical confinement; parallel optical interconnects; projected useful life; reliability; stress conditions; twelve wide array form factor; wet oxidation; Acceleration; Business; Gallium arsenide; Manufacturing; Optical interconnections; Optical transmitters; Power generation; Stress; Temperature distribution; Vertical cavity surface emitting lasers;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics Society, 2001. LEOS 2001. The 14th Annual Meeting of the IEEE

Conference_Location

San Diego, CA

ISSN

1092-8081

Print_ISBN

0-7803-7105-4

Type

conf

DOI

10.1109/LEOS.2001.968858

Filename

968858