Title :
VCSEL based parallel optical interconnect reliability
Author_Institution :
W.L. Gore & Associates Inc., Lompoc, CA, USA
Abstract :
Reliability of parallel optical interconnects (POI) is very critical because of the high cost of system down time. The high reliability standards established for telecom applications are even more challenging in a twelve wide array form factor. From a reliability viewpoint the limiting components are the optoelectronic devices. Reliability of the devices in the Gore nLIGHTENTM POI module is reviewed with emphasis being placed on the VCSEL transmitters
Keywords :
laser reliability; optical interconnections; optical transmitters; semiconductor laser arrays; surface emitting lasers; Gore nLIGHTEN module; PIN photodetectors; VCSEL transmitters; acceleration factors; failure distribution; lifetime predictions; optical confinement; parallel optical interconnects; projected useful life; reliability; stress conditions; twelve wide array form factor; wet oxidation; Acceleration; Business; Gallium arsenide; Manufacturing; Optical interconnections; Optical transmitters; Power generation; Stress; Temperature distribution; Vertical cavity surface emitting lasers;
Conference_Titel :
Lasers and Electro-Optics Society, 2001. LEOS 2001. The 14th Annual Meeting of the IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-7105-4
DOI :
10.1109/LEOS.2001.968858
