DocumentCode :
1962965
Title :
Squeezing characteristics of new transverse-junction-stripe semiconductor lasers
Author :
Lathi, S. ; Inoue, S. ; Yamamoto, Y. ; Tanaka, K. ; Kan, H.
Author_Institution :
Edward L. Ginzton Lab., Stanford Univ., CA, USA
fYear :
1998
fDate :
8-8 May 1998
Firstpage :
171
Lastpage :
172
Abstract :
Summary form only given.Semiconductor lasers driven by a constant current source are expected to generate intensity-squeezed light when the laser is biased far above threshold. However, most semiconductor lasers do not exhibit intensity squeezing. To generate squeezed light from a semiconductor laser, low-threshold, high quantum-efficiency, stable single longitudinal and polarization mode operations are indispensable. We have achieved low threshold (1.6 mA at 80 K) and high external quantum efficiency (0.75 at 80 K) in transverse-junction stripe GaAs lasers by making the laser cavity short (200 /spl mu/m), and by designing the junction structure for good confinement of the carriers and heavily doping the active layer.
Keywords :
III-V semiconductors; gallium arsenide; laser cavity resonators; laser modes; laser noise; laser theory; light polarisation; optical squeezing; semiconductor lasers; shot noise; 1.6 mA; 200 mum; 80 K; GaAs; active layer; constant current source; far above threshold; heavily doping; high external quantum efficiency; high quantum-efficiency; intensity squeezing; intensity-squeezed light; junction structure; laser cavity; low threshold; low-threshold; polarization mode operations; semiconductor laser; squeezed light; squeezing characteristics; stable single longitudinal; transverse-junction stripe GaAs lasers; transverse-junction-stripe semiconductor lasers; Laser modes; Laser noise; Laser theory; Noise level; Noise reduction; Optical noise; Pump lasers; Semiconductor device noise; Semiconductor lasers; Solitons;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Quantum Electronics Conference, 1998. IQEC 98. Technical Digest. Summaries of papers presented at the International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-541-2
Type :
conf
DOI :
10.1109/IQEC.1998.680348
Filename :
680348
Link To Document :
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