Title :
High-resolution and wide-dynamic range time-to-digital converter with a multi-phase cyclic Vernier delay line
Author :
Mino Kim ; Woo-Yeol Shin ; Gi-Moon Hong ; Jihwan Park ; Joo-Hyung Chae ; Nan Xing ; Jong-Kwan Woo ; Suhwan Kim
Author_Institution :
Electr. Eng., Seoul Nat. Univ., Seoul, South Korea
Abstract :
In this paper, we propose a time-to-digital converter (TDC) that uses a multi-phase cyclic Vernier delay line (VDL) to achieve the high-resolution and wide-dynamic range. Its control voltages are provided by two phase-locked loops (PLLs) to compensate for the process and ambient variations. The two PLLs share a single reference clock and have different frequency-division ratios. It also improves the resolution of the TDC. A prototype chip, designed and fabricated in 0.18μm CMOS technology with an active area of 0.40mm2, achieves a 3.4ps of resolution and an input range of 100ns at 2.5M samples/s, while consuming 32mW from a 1.8V supply.
Keywords :
CMOS integrated circuits; delay lines; phase locked loops; time-digital conversion; CMOS technology; TDC; VDL; frequency-division ratio; multiphase cyclic Vernier delay line; phase locked loops; power 32 mW; reference clock; size 0.18 mum; time-to-digital converter; voltage 1.8 V; wide dynamic range; CMOS integrated circuits; Clocks; Delay lines; Delays; Dynamic range; Phase locked loops; Radiation detectors;
Conference_Titel :
ESSCIRC (ESSCIRC), 2013 Proceedings of the
Conference_Location :
Bucharest
Print_ISBN :
978-1-4799-0643-7
DOI :
10.1109/ESSCIRC.2013.6649135