DocumentCode
1963077
Title
Automated testing and parameter extraction of solar cells fabricated from 6-8 inch large test wafers
Author
Guvenc, M.G. ; Gurcan, C. ; Denis, A.M. ; MacDonald, D.
Author_Institution
Univ. of Southern Maine, Portland, ME, USA
fYear
2003
fDate
30 June-2 July 2003
Firstpage
364
Lastpage
365
Abstract
This paper describes the design, operation and use of a PC controlled test setup designed specifically to measure the I-V characteristics of large area solar cells operated under simulated solar irradiation for the purpose of testing their quality and determining their optimal operation points for maximum electrical output. The project included design of a wafer-prober and solar-simulator combination so that large area wafers could be tested.
Keywords
CAMAC; short-circuit currents; solar absorber-convertors; solar cells; 6 to 8 inch; automated testing; current-voltage curves; electrical output; large test wafers; optimal operation; parameter extraction; simulated solar irradiation; solar cells; wafer prober-solar simulator; Automatic testing; Current measurement; Lamps; Parameter extraction; Photovoltaic cells; Semiconductor device testing; Short circuit currents; Silicon; Solar radiation; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
University/Government/Industry Microelectronics Symposium, 2003. Proceedings of the 15th Biennial
ISSN
0749-6877
Print_ISBN
0-7803-7972-1
Type
conf
DOI
10.1109/UGIM.2003.1225768
Filename
1225768
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