• DocumentCode
    1963388
  • Title

    An improved design of the embedded electronic measurement system

  • Author

    Bai, Ying-Wen ; Jau, Wei-Chun

  • Author_Institution
    Dept. of Electron. Eng., Fu Jen Catholic Univ., Taipei
  • fYear
    2009
  • fDate
    11-13 May 2009
  • Firstpage
    214
  • Lastpage
    219
  • Abstract
    In this paper we integrate an embedded board with interface circuits in a design of an embedded electronic measurement system (EEMS) with a new human-machine touch panel interface. The EEMS includes general electronic measurement instruments such as a waveform generator, an oscilloscope and a power supply. We integrate three electronic measurement instrument interfaces into one window which works in cooperation with the touch panel. We also enhance the program by having the system fetch the touching position, so that it can do this continuously. We use and process the touching positions to improve aspects of the operation of the human-machine interface like the drawing and the shifting adjustment of the arbitrary waveform, so that the operation interface becomes more user-friendly. We also design a mean filter program which adds up and averages both the touch point and neighboring points, so that the arbitrary waveform can be outputted more smoothly.
  • Keywords
    computerised instrumentation; haptic interfaces; measurement systems; electronic measurement instrument interface; embedded board; embedded electronic measurement system; general electronic measurement instrument; human-machine interface; human-machine touch panel interface; interface circuits; operation interface; oscilloscope; power supply; waveform generator; Embedded system; Filters; Flowcharts; Industrial electronics; Instruments; Integrated circuit measurements; Laboratories; Man machine systems; Oscilloscopes; Signal generators; embedded system; mean filter; precision; pulling; touch panel;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Virtual Environments, Human-Computer Interfaces and Measurements Systems, 2009. VECIMS '09. IEEE International Conference on
  • Conference_Location
    Hong Kong
  • ISSN
    1944-9410
  • Print_ISBN
    978-1-4244-3808-2
  • Electronic_ISBN
    1944-9410
  • Type

    conf

  • DOI
    10.1109/VECIMS.2009.5068896
  • Filename
    5068896